Self-Aligned Focusing Schlieren (SAFS)

Focusing schlieren made easy

Near-planar density-gradient measurements

Based on NASA technology, our SAFS design allows for near-planar measurements without the hassle of traditional line-of-sight and focusing schlieren setups.

0 mm

25 mm

50 mm

Advantages of SAFS

High sensitivity

SAFS sensitivity to density gradients is equal to or greater than traditional schlieren setups.

Variable FOV

Whether you want to measure micro-fluidics or full-scale vehicle flows, this system does it all.

Localized schlieren measurements

Our systems provide near-planar schlieren measurements in the most challenging scenarios.

Ease-of-use

Unlike traditional schlieren setups, our SAFS units can be set up in a matter of minutes while still providing leading-class measurements.

Vibration resistant

Our SAFS systems are the only schlieren systems that are insensitive to facility vibrations.

Minimal optical access

Our SAFS setups are the only schlieren systems that require a single, small optical access point.

Compactness

Able to fit in a carry-on case, our SAFS systems provide more capability per cubic centimeter than any other schlieren system.

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Peer through the noise and reveal the relevant features

Example: Schlieren images of hypersonic boundary layer.